Identification system and method for recognizing any one of a number of ...
Filed: June 19th, 2003 [Granted]
Patent Number: 7890284
Ignatiev et al Pickett et al. Carroll et al. Takahashi Gendo et al Miller et al Scarlett et al Voltz Young Kirkpatrick et al. Mallory et al. Lim et al.
System for determining the true electrical characteristics of a device
Filed: June 10th, 2004 [Granted]
Patent Number: 7912668
... Al 2004/0101144 Al 2004/0122541 Al 2004/0259435 Al 2004/0260846 Al 2005/ 0086175 Al Ignatiev et al. Pickett et al Carroll et al. Takahashi Gendo et al.
Inverted variable resistance memory cell and method of making the same
Filed: May 8th, 2007 [Granted]
Patent Number: 7718533
Jacobson et al. Moore et al. Ignatiev et al. Moon et al. Campbell et al. Campbell Moore et al. Mattson Nejad et al. Nazarian FOREIGN PATENT DOCUMENTS EP JP ...
Toll free calling account recharge system and method
Filed: March 30th, 2009 [Granted]
Patent Number: 7979051
Gallagher et al. Bronner et al. Sun Henderson et al. Monsma et al. Frisk Dahm et al. Ignatiev et al. Raith Justice et al. Hsu et al. Hsu et al. Chan et al.
Low resistance splice for high temperature superconductor wires
Filed: July 23rd, 2007 [Granted]
Patent Number: 8030246
505/237 Rupich et al. Ignatiev et al. Thieme et al. Thieme et al. Li et al. Malozemoff et al. 7071148 B1* 7/2006 7365271 B2* 4/2008 7772158 B2* 8/2010 ...
Electrically programmable resistance cross point memory sensing method
Filed: March 3rd, 2004 [Granted]
Patent Number: 6925001
6128214 A 6198208 Bl 6204139 Bl 6473332 Bl 6479848 B2 10/2000 3/2001 3/2001 10/ 2002 11/2002 Kuekes et al. Yano et al. Liu et al. Ignatiev et al. Park et al.
Semiconductor memory device
Filed: January 5th, 2006 [Granted]
Patent Number: 7668001
21, 2006 (65) Prior Publication Data US 2009/0135641 Al May 28, 2009 (30) Foreign ... Ignatiev et al. Zhuang et al. Tamai et al. Choi et al. Hosoi et al.
Method for using a multi-use memory cell and memory array
Filed: July 31st, 2006 [Granted]
Patent Number: 7447056
Knall et al. Ignatiev Taussig Sharma et al. Johnson et al Tringali et al. Taussig et al Kunikiyo et al. Friedman et al. Scheuerlein Hurst et al. March et al ...