Scanning magnetic microscope patents

Scanning magnetic microscope having improved magnetic sensor

Filed: June 6th, 2001 [Granted]

Assignee: Brown University Research Foundation

Patent Number: 6657431

1 SCANNING MAGNETIC MICROSCOPE HAVING IMPROVED MAGNETIC SENSOR CLAIM OF PRIORITY FROM A PROVISIONAL PATENT APPLICATION 5 This patent application claims ...

Scanning magnectic microscope having improved magnetic sensor

Filed: April 28th, 2004 [Pending]

Patent Application Number: 10493831

TECHNICAL FIELD AND INDUSTRIAL APPLICABILITY [0002] This invention pertains to a high resolution and sensitive magnetic microscope using one of a plurality ...

High resolution scanning magnetic microscope operable at high temperature

Filed: March 7th, 2003 [Granted]

Assignee: Brown University Research Foundation

Patent Number: 6930479

1 HIGH RESOLUTION SCANNING MAGNETIC MICROSCOPE OPERABLE AT HIGH TEMPERATURE PRIORITY STATEMENT 5 This application claims priority to International Patent ...

SPIN MICROSCOPE BASED ON OPTICALLY DETECTED MAGNETIC RESONANCE

Filed: August 28th, 2007 [Pending]

Patent Application Number: 11846081

A scanning magnetic microscope of claim 3, wherein said radio frequency coil produces a field that is oscillating in the vicinity of the frequency resonant ...

Scanning AC hall microscope

Filed: March 20th, 2000 [Granted]

Assignee: NEC Research Institute Inc

Patent Number: 6396261

The last decade has seen an explosion in the types and techniques used in scanning microscopy in general. Among them is the subfield of scanning magnetic ...

Scanning evanescent electro-magnetic microscope

Filed: October 23rd, 2000 [Granted]

Assignee: The Regents of the University of California

Patent Number: 6532806

18, 2003 (54) SCANNING EVANESCENT ELECTRO-MAGNETIC MICROSCOPE (75) Inventors: Xiao-Dong Xiang, Alameda, CA (US); Chen Gao, Anhui (CN); Peter G. Schultz, ...

Hybrid squid microscope with magnetic flux-guide for high resolution ...

Filed: September 15th, 2004 [Granted]

Assignee: Neocera LLC

Patent Number: 7262597

In the method of the present invention, the magnetic sensor is ... 2, the scanning magnetic microscope 10 includes a magnetic sensor 12 and a fiber probe 14 ...

Scanning probe microscope for ultra sensitive electro-magnetic field ...

Filed: December 27th, 2002 [Granted]

Assignee: Seiko Instruments Inc National Institute of Advanced Industrial Sciency and Technology

Patent Number: 6817231

1 SCANNING PROBE MICROSCOPE FOR ULTRA SENSITIVE ELECTRO-MAGNETIC FIELD DETECTION AND PROBE THEREOF 5 BACKGROUND OF THE INVENTION 1.