5 nanometer Ta/x nm Cu/2 nm NiFe/0.5 nm CoFe/2 nm Cu/2.5 nm CoFe/0.9 nm Ru/2 nm CoFe/10 nm PtMn/5 nanometer Ta (7-3) 5 nanometer Ta/x nm Ru/y nm Cu/2 nm ...

Al: Ni08Fe02(2 nm)/Co(x nm)/Cu(2 nm)/Co(2 nm) The characteristics of the MR devices AO and Al fabricated in such a manner were evaluated by a direct current ...

Compound (Elansolid Bx) having the following parameters: C37HS007, MW=606.8, ESIMS: m/z 605.3 [MH]"; UV: X [nm] (Ig=262 (sh 4.61), 272 (4.65), 282 (4.69), ...

TABLE II tCo L (thickness) tPt nm 6k Mr/Ms He 10 15 20 FIG. 5 shows the magneto- optical hysteresis loops measured at a wavelength X of 530 nm of six ...

Layer structure of these samples was Si/Al203/NiCr (5 nm)/NiFe (1.5 nm)/Ta (0.2 nm)/NiFe (1 nm)/CoFe (1.5 nm)/Cu (x nm)//Cu (2.1-x nm)/CoFe (2.5 nm)/Ru (0.8 ...

[0140] When the value of the dynamic range at the position at a distance of X nm is read from the dynamic range characteristics stored ...

P r P \ P ^ a[m]x[nm] = \ hkzTP^ a[m]z%~m~l (2.15) [0037] The polynomial from equation (2.11) can once again be seen in the right-hand part of the summation ...

... to the peak luminance of light from the backlight is at least 5 nm. ... the relative interference intensity P with respect to a wavelength X (nm) is ...