Rtfz(546)<1.0 (F) wherein Re (X) is a in-plane retardation (nm) (ie, a retardation in a plane of the optical compensation sheet) at a wavelength of X nm; ...

In this case, a 100 nm Au film was formed just above the magnetoresistance ... were equally x nm. [0104] FIG. 6 is a graph diagram that shows dependency of ...

1, 2006 (54) XNM - AN INTERFACE FOR A NETWORK MANAGEMENT SYSTEM (75) Inventors: Prakash Chandra, Union City, CA (US); Ajit Parthan, Sunnyvale, ...

... wave range not less than 650 [nm] have values not more than a threshold value ... a wavelength X[nm] of the light emitted from said illumination means, ...

1 63 and RthsuJX thereof is 0.332 to 0.357 when And/X of the liquid crystal at a wavelength of 650 nm is 0.454, has a low transmittance in the dark state ...

[0029] wherein Re^X) and Re2(X) are Re of the first retardation layer and Re of the second retardation layer, respectively, at a wavelength of X nm measured ...

The Re(X) can be determined by irradiating a light of wavelength X nm along a normal line of a film using KOBRA 21ADH (by Oji Scientific Instrument).

[0116] Mathematical formula 1: x(nm)=k-log(t)+C (1) [0117] In the formula, x denotes the expected thickness (unit: nm) of the barrier layer 7, ...